Products

Standard Test Systems

Analog IC Tester - STS8200

PMIC Tester - STS8300

Discrete Test Solution

Power Discrete Test System-STS8203

Multi-Site MOSFET Test System-STS8202

GaN FET

Power Module Test Solution

IPM Test Kit

PIM Test Solution

Standard Test Systems

Analog IC Tester - STS8200

System Features:

Flexible Configuration: Up to 26 slots in the mainframe, enabling customization and scalability.
Specialized Testing: Focuses on Analog, Linear, PMIC, and Power IC testing, providing targeted solutions.
Advanced Source Capabilities: Full floating V/I source with per pin 16-bit Digitizer and AWG (Arbitrary Waveform Generator); options for high voltage and high power V/I sources.
Comprehensive Measurement Tools: Includes AC source/meter with AWG and Digitizer, multi-channel high-resolution time measurement unit, and up to 32 digital channels operating at a 5 MHz test rate per channel.
Enhanced Debugging: Graphic debug tools for streamlined troubleshooting and analysis.
Multi-Site Testing: Supports up to 16 sites with true multi-site test capabilities, including Pingpong mode, TWIN mode, and Multi-task function for optimized testing efficiency.
Upgradeable: Can be upgraded to a mixed signal tester with an additional test head, ensuring long-term adaptability.

PMIC Tester - STS8300

System Features:

ALL-in-ONE Design: Integrates all Analog V/I sources, VI sources, and Digital channels directly in the test head, simplifying setup and operation.
High Pin-Count Capability: Specially designed for high pin-count PMICs and high-parallel analog IC testing, ensuring efficiency and accuracy.
Extensive Analog Channel Capacity: Supports more than 500 analog channels, providing robust testing capabilities for complex circuits.
Massive Parallel Testing: Enables parallel testing of more than 32 sites with a hard docking solution, maximizing throughput and reducing test time.

Discrete Test Solution

Power Discrete Test System-STS8203

System Features:

Specialized Power Discrete Device Testing: Tailored for testing MOSFETs, Schottky diodes, and IGBTs, ensuring precise and reliable evaluations.
High-Performance DC Testing: Supports up to 2000V/200A DC test capability, making it suitable for high-power applications.
Advanced Test Options: Includes UIS (Unclamped Inductive Switching), DVDS (Drain-Source Voltage), and ZMU (Capacitance and Resistance) testing options, covering Ciss, Coss, Crss, and Rg parameters.
Multi-Function Test Mode: Enables simultaneous DC and AC testing, interfacing with different test stations for comprehensive test coverage.
User-Friendly Programming: Features menu-driven programming, simplifying the test setup and operation process.
Flexible Expansion: Can be expanded to an Analog IC tester under the “CROSS” mainframe, offering adaptability for future testing needs.

Multi-Site MOSFET Test System-STS8202

System Features:

High-Efficiency MOSFET Wafer Testing: Capable of testing up to 16 sites simultaneously, with each site supporting up to 100V/10A, ensuring rapid and reliable testing processes.
High Voltage Testing Option: Expandable to support high voltage tests up to 1000V, accommodating a wide range of testing requirements.
UIS (Unclamped Inductive Switching) Test Capability: Includes an option for UIS testing up to 10A, essential for evaluating the robustness of power devices.
Versatile AC Testing: Offers additional options for various AC testing needs, providing comprehensive testing solutions for diverse applications.

GaN FET

System Features:

GaN Test Kit Compatibility: Designed for use with the AccoTEST standard test platforms STS8200 or STS8300, providing a robust solution for GaN device testing.
Multi-Site Testing Capability: Supports up to quad-site testing with one kit, and can be expanded to support two kits for 8-site parallel testing, maximizing testing efficiency.
Advanced VI Source: Fully floating VI source capable of delivering up to 1000V/10A DC, with an option to extend to 2000V/20A, ensuring versatile and powerful testing.
Low Leakage Testing: Includes a low leakage test module with a sensitivity of less than 1nA, ideal for precise leakage current measurements.
User-Friendly Programming: Features menu-driven programming for ease of use and streamlined test setup.
Dynamic Ron Test Option: Offers an optional Dynamic Ron test capability, providing comprehensive testing for GaN devices.

Power Module Test Solution

IPM Test Kit

System Features:

PIM Test Kit Based on STS8200: Tailored for high-performance testing.
Max Voltage and Current for Switching:
- 1200V/2000A (SW)
- 1200V/6000A (SC)
- 1200V/2000A (Qg, upgradeable)
- 1200V/2000A (RBSOA, upgradeable)
Max Voltage and Current for DC: 2000V/1000A
Low Stray Inductance: Ensures accurate and stable measurements.
Multi-task and One Socket Test: Efficient testing with multiple tasks handled simultaneously.
Target Devices:
- EV/HEV Modules
- Power Integrated Modules
- SPM/IPM

PIM Test Solution

System Features:

PIM Test Kit Based on STS8200: Designed for robust and comprehensive testing of Power Integrated Modules (PIM) and related devices.
Max Voltage and Current for Switching:
- 1200V/2000A (SW)
- 1200V/6000A (SC)
- 1200V/2000A (Qg, upgradable)
- 1200V/2000A (RBSOA, upgradable)
Max Voltage and Current for DC: Capable of handling up to 2000V/1000A for direct current testing.
Low Stray Inductance: Ensures minimal interference, providing accurate and reliable test results.
Multi-Task and One Socket Test: Efficient testing with multi-tasking capabilities and single socket operation.
Target Devices:
- EV/HEV Modules
- Power Integrated Modules (PIM)
- SPM/IPM (Smart Power Modules/Intelligent Power Modules)

About Accotest

AccoTest by Beijing Huafeng Test & Control Technology Co., Ltd.

AccoTest, developed by Beijing Huafeng Test & Control Technology Co., Ltd. (Huafeng), represents the pinnacle of over 20 years of innovation in the semiconductor testing equipment industry. Specializing in analog and mixed-signal testing solutions, AccoTest has become synonymous with high performance and reliability. As a key product line under Huafeng, AccoTest has established itself as a leader in the field of semiconductor testing.

Huafeng’s dedication to delivering high-performance products and providing timely service and support has positioned AccoTest as the leading ATE supplier in mainland China. AccoTest systems are also widely used in key global markets, including Taiwan, the United States, Europe, Korea, Japan, and other advanced semiconductor regions. With over 3,000 systems installed worldwide, AccoTest serves a diverse clientele ranging from design houses to assembly and test facilities, as well as IDMs (Integrated Device Manufacturers).

NXTREV Technology Inc. is proud to partner with AccoTest, bringing their state-of-the-art semiconductor testing solutions to the Philippines. As the official representative of AccoTest in the region, NXTREV ensures that our local clients have access to cutting-edge technology and reliable support. We are committed to helping our customers enhance their testing capabilities, providing them with the tools and services needed to succeed in the highly competitive semiconductor market.

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